Description
Multichannel wavelength-dispersive spectrometer with a scanning channel
The instrument is designed for simultaneous analysis of up to 36 main elements (fixed channels) and sequential determination of up to 48 elements using a scanning channel for quality control or research purposes. High analytical precision of the spectrometer is ensured even when measuring trace element concentrations (at the level of a few ppm).
Features
- Thanks to the original design of the converging spectrometric system, the focus does not diverge and becomes extremely small at the secondary slit, resulting in extremely high X-ray intensity with excellent resolution compared to other systems.
- Excellent measurement reproducibility has been achieved for light elements (such as Be, B, C, Al, and Si).
- The calibration curve can cover more than 3,000,000 cps (from 0% to 100%), ensuring high accuracy even in the high-concentration region where X-ray intensity is very high.
- Analytical information can be customized for each individual sample and element. The automatic sensitivity correction (counter loss correction) function is also available.
- Simultaneous determination of up to 36 main and trace elements. The scanning monochromator allows for automatic qualitative analysis and can also be used for quantitative measurements.
- Standard and control samples can be safely placed on the autosampler (8 positions) for extended periods, as the unit is equipped with a dust cover.
- A reliable pendulum-type sample introduction system replaces samples within 5 seconds in a single movement. This simple design minimizes downtime and ensures stable operation even under high workload conditions.
