Description
X-ray Diffractometer
The device with a high-precision vertical θ-θ goniometer is designed for the analysis of various samples, including large ones up to 350 mm in diameter and 190 mm thick. The diffractometer’s design enables automatic stress mapping across the entire sample surface. Any point on the sample can be selected for measurement, and a set of CCD cameras allows visual confirmation of the measurement position directly on the display.
Features
- Polycapillary optics system provides a high-intensity parallel X-ray beam and significantly improves the signal-to-noise ratio.
- Anti-monochromator reduces background for higher data quality.
- Autonomous water cooling system ensures stable performance during long measurements.
- Precise determination of lattice parameters, residual austenite, crystallinity degree, crystallite size, stress, and texture analysis with Rietveld software.
- Supports qualitative and quantitative analysis using PDF-2 and PDF-4 databases.
